Internal-node waveform probing of MMIC power amplifiers
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 127-130
- https://doi.org/10.1109/mcs.1995.470975
Abstract
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This publication has 2 references indexed in Scilit:
- Hot-electron-induced degradation of metal-semiconductor field-effect transistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Non-invasive waveform probing for nonlinear network analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002