Characterization of coatings
- 1 December 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 39, 3-23
- https://doi.org/10.1016/0040-6090(76)90620-9
Abstract
No abstract availableKeywords
This publication has 32 references indexed in Scilit:
- Secondary-ion emission of amino acidsApplied Physics B Laser and Optics, 1976
- Developments in secondary ion mass spectroscopy and applications to surface studiesSurface Science, 1975
- Criteria for bombardment-induced structural changes in non-metallic solidsRadiation Effects, 1975
- Long Journey into TunnelingScience, 1974
- Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copperRadiation Effects, 1973
- Implications in the use of secondary ion mass spectrometry to investigate impurity concentration profiles in solidsRadiation Effects, 1973
- Microanalysis of Materials by Backscattering SpectrometryScience, 1972
- A method for surface analysis by sputtered neutralsPhysics Letters A, 1972
- Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemissionThe European Physical Journal A, 1970
- Analysis of Submonolayers on Silver by Negative Secondary Ion EmissionPhysica Status Solidi (b), 1969