A theoretical assessment of the possibility of selected-area mass-spectrometric analysis using a focused ion beam
- 1 September 1965
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 16 (9) , 1277-1284
- https://doi.org/10.1088/0508-3443/16/9/306
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Sputtering experiments in the high energy regionNuclear Instruments and Methods, 1961
- Collection and sputtering experiments with noble gas ionsNuclear Instruments and Methods, 1961
- Secondary Positive Ion Emission from Metal SurfacesJournal of Applied Physics, 1959
- Sputtering of Surfaces by Positive Ion Beams of Low EnergyJournal of Applied Physics, 1958
- Focal properties and chromatic and spherical aberrations of the three-electrode electron lensBritish Journal of Applied Physics, 1956