Simple Semiempirical Method of Calculating van der Waals Interactions in Thin Films from Lifshitz Theory

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Abstract
The influence of different representations of the dispersion dependence ε (i ξ) on calculating van der Waals interactions from Lifshitz theory is studied. It is shown that with satisfactory accuracy ε (i ξ) can be described by means of Krupp's empirical formula [ε (i ξ) -1]/[ε (i ξ) +1] = a · exp(-b ξ). Making use of that formula a simple expression for the Hamaker function A (h, T) is obtained. Numerical calculations are carried out, the results being compared with those of other authors and with experimental data.

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