Hydrogenated amorphous silicon studied by scanning tunneling microscopy
- 1 May 1988
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 63 (9) , 4515-4517
- https://doi.org/10.1063/1.340148
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Local tunneling barrier height images obtained with the scanning tunneling microscopeSurface Science, 1987
- Scanning tunneling microscopy of nanocrystalline silicon surfacesSurface Science, 1986
- Surface morphology of oxidized and ion-etched silicon by scanning tunneling microscopyApplied Physics Letters, 1985
- Voltage drop in the experiments of scanning tunneling microscopy for SiPhysical Review B, 1984
- Scanning tunneling microscopySurface Science, 1983