Current single event effect test results for candidate spacecraft electronics

24 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 19-27
https://doi.org/10.1109/redw.1996.574184

Abstract

We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC converters.

Keywords

ELECTRONIC EQUIPMENT TESTING
SPACE VEHICLES
AEROSPACE ELECTRONICS
PROTONS
PERFORMANCE EVALUATION
SINGLE EVENT UPSET
LABORATORIES
TEST FACILITIES
USER CENTERED DESIGN
PHYSICS

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