Defect analysis of epitaxial Ag films on silicon by MeV ion channeling
- 1 July 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 233 (1-2) , 115-122
- https://doi.org/10.1016/0039-6028(90)90182-8
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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