Evaluation of the composition of reactively evaporated GeOx thin films from optical transmission and XPS data
- 1 December 1988
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 23 (12) , 4363-4368
- https://doi.org/10.1007/bf00551932
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- XPS Study on a‐GeOx (1.3 < x < 2) Films Prepared from GeO2Physica Status Solidi (b), 1985
- Characterization of Al-AlOx and Sn-SnOx cermet films deposited by reactive evaporationThin Solid Films, 1983
- Chemical bond and related properties of SiO2. VII. Structure and electronic properties of the SiOx region of Si–SiO2 interfacesPhysica Status Solidi (a), 1980
- Correlations between ESCA chemical shifts and modified sanderson electronegativity calculationsJournal of Electron Spectroscopy and Related Phenomena, 1977
- Remote inductive effects evaluated by x-ray photoelectron spectroscopy (ESCA)Journal of the American Chemical Society, 1974
- Metallic aluminum particle concentration in aluminum oxide thin filmsJournal of Applied Physics, 1974