Electron loss study of the native oxide of tin

• 1 April 1982
• journal article
• Published by American Vacuum Society in Journal of Vacuum Science and Technology
• Vol. 20  (4) , 943-945
• https://doi.org/10.1116/1.571648

Abstract

Keywords

• CHEMICAL ANALYSIS
• AUGER ELECTRON SPECTROSCOPY
• MEAN FREE PATH
• ELECTRON BEAM
• QUANTUM MECHANICS
• ELECTRON SPECTROSCOPY
• CHEMICAL REACTION
• CHARGED PARTICLES
• ION BEAM
• SOLID STATE PHYSICS
• ROOM TEMPERATURE