Accuracy of the emission-transmission method applied in XRF analysis of intermediate thickness samples
- 1 April 1992
- journal article
- Published by Springer Nature in Journal of Radioanalytical and Nuclear Chemistry
- Vol. 158 (2) , 409-415
- https://doi.org/10.1007/bf02047126
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Least‐squares fits of fundamental parameters for quantitative x‐ray analysis as a function of Z (11 ≤ Z ≤ 83) and E (1 keV ≤ E ≤ 50 keV)X-Ray Spectrometry, 1985
- Absorption correction via scattered radiation in energy-dispersive x-ray fluorescence analysis for samples of variable composition and thicknessAnalytical Chemistry, 1980
- Automatic absorption correction in x‐ray fluorescence analysis of intermediate thickness samples using a dual external reference signalX-Ray Spectrometry, 1980
- New basic empirical expression for computing tables of X‐ray mass attenuation coefficientsX-Ray Spectrometry, 1979
- Determination of trace elements in light element matrices by x-ray fluorescence spectrometry with incoherent scattered radiation as an internal standardAnalytical Chemistry, 1979
- A method of correction for absorption matrix effects in samples of ‘intermediate’ thickness in EDXRF analysisX-Ray Spectrometry, 1979
- Matrix corrections for energy dispersive x-ray fluorescence analysis of environmental samples with coherent/incoherent scattered x-raysAnalytical Chemistry, 1977
- Trace element determination with semiconductor detector x-ray spectrometersAnalytical Chemistry, 1973
- Die sekundäranregung bei der Röntgenfluoreszenzanalyse ebener dünner schichtenSpectrochimica Acta Part B: Atomic Spectroscopy, 1971
- X-Ray Quantitative Analysis by an Emission-Transmission Method.Analytical Chemistry, 1966