Integrated approach using neural networks for fault detection and diagnosis
- 1 January 1990
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 317-326 vol.1
- https://doi.org/10.1109/ijcnn.1990.137588
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- A neural network methodology for process fault diagnosisAIChE Journal, 1989
- Artificial neural network models of knowledge representation in chemical engineeringComputers & Chemical Engineering, 1988
- An object-oriented two-tier architecture for integrating compiled and deep-level knowledge for process diagnosisComputers & Chemical Engineering, 1988
- An expert system approach to malfunction diagnosis in chemical plantsComputers & Chemical Engineering, 1988
- Narrowing diagnostic focus using functional decompositionAIChE Journal, 1988
- Model-based reasoning in diagnostic expert systems for chemical process plantsComputers & Chemical Engineering, 1987