The measurement and interpretation of dielectric properties
- 1 February 1983
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 100 (4) , 329-334
- https://doi.org/10.1016/0040-6090(83)90157-8
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Thin film dielectrics—The futureThin Solid Films, 1983
- The dielectric behaviour of condensed matter and its many-body interpretationContemporary Physics, 1983
- A new understanding of the dielectric relaxation of solidsJournal of Materials Science, 1981
- Dielectric properties of stearic acid multilayersThin Solid Films, 1980
- Presentation and interpretation of dielectric dataThin Solid Films, 1978