Thermopower in epitaxial thin films
- 1 November 1989
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 40 (13) , 9374-9377
- https://doi.org/10.1103/physrevb.40.9374
Abstract
Thermopower measurements are reported in several perfect epi- taxial thin films above 80 K. A prominent peak was observed both in the in-plane and out-of-plane thermopower ( and ) and it is associated with the perfectness of the crystal structure of the sample. Above 140 K, is almost temperature independent with small positive value (about 0.2 μV/K), and increases with linear temperature dependence. The slope /dT is about 2.6× μV/ which is much greater than expected in a metal.
Keywords
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