On X-ray and electron microscopic characterization of lattice defects in AIIBVI semiconductor compounds
- 16 October 1979
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 55 (2) , 603-609
- https://doi.org/10.1002/pssa.2210550230
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- The structure of vacuum-evaporated CdxHg1−xTe thin filmsThin Solid Films, 1977
- Vapour phase chemical transport properties of the cadmium telluride-iodine systemRevue de Physique Appliquée, 1977
- The effect of diffusion of Ag on the real structure of ZnTe crystalsPhysica Status Solidi (a), 1976
- Some remarks on the real structure investigation of ZnTe and CdTe crystals by transmission microscopyPhysica Status Solidi (a), 1974
- Band Structure of HgTePhysica Status Solidi (b), 1965