High resolution electron microscopy of bismuth oxides with perovskite layers
- 1 March 1987
- journal article
- Published by Springer Nature in Bulletin of Materials Science
- Vol. 9 (1) , 29-35
- https://doi.org/10.1007/bf02744390
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Superstructures exhibited by oxides of the aurivillius family, (Bi2O2)2+ (An−1BnO3n+1)2−Materials Research Bulletin, 1987
- Intergrowth structures in inorganic solids: A new class of materialsBulletin of Materials Science, 1985
- Intergrowth structures: the chemistry of solid-solid interfacesAccounts of Chemical Research, 1985
- A homologous series of recurrent intergrowth structures of the type Bi4Am + n − 2Bm + nO3(m + n) + 6 formed by oxides of the aurivillius familyJournal of Solid State Chemistry, 1984
- Stability of layered bismuth compounds in relation to the structural mismatchMaterials Research Bulletin, 1979
- Lattice imaging by high resolution electron microscopy: The role of high resolution electron microscopy in solid state chemistryProceedings of the Indian Academy of Sciences - Section A, 1978
- Electron microscopy of ferroelectric bismuth oxides containing perovskite layersProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1977
- Crystal Chemistry of Mixed Bismuth Oxides with Layer‐Type StructureJournal of the American Ceramic Society, 1962