Influence of the Substrate on the Electrical Properties of Thick-Film Resistors
Open Access
- 1 March 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 3 (1) , 181-186
- https://doi.org/10.1109/tchmt.1980.1135584
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Electrical properties and conduction mechanisms of Ru-based thick-film (cermet) resistorsJournal of Applied Physics, 1977
- Influence of the Metal Migration From Screen‐and‐Fired Terminationson the Electrical Characteristics of Thick‐Film ResistorsActive and Passive Electronic Components, 1977
- Electrical Conduction by Percolation in Thick Film ResistorsActive and Passive Electronic Components, 1976
- Structure and dc electrical properties of a Au–Rh-glass thick-film systemJournal of Applied Physics, 1974
- Hopping Conductivity in Disordered SystemsPhysical Review B, 1971
- Effect of thermal strains on the temperature coefficient of resistanceThin Solid Films, 1970