Analysis of dendrite patterns by use of an adaptive scan system*

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Abstract
SUMMARY: A scanning procedure is described by which means morphometric parameters of dendrite tree structures may be collected with low operator interaction. The system requires a small computer with 4K core and interfacing to A/D and D/A converters, a scanning oscilloscope, a standard microscope and a photo‐multiplier tube. Modular, or local pattern information is sampled on a circular scan raster, and standardized patterns specified in terms of the number of dendrite processes scanned. These modular patterns are linked together to map a chord approximation of the object. Branches out of focus are recognized and the stage adjusted by remote control of a stepping motor. The paper records a pilot study, performed at the Department of Anatomy, University of Rochester, N. Y.

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