Flash EEPROM Cell scaling based on tunnel oxide thinning limitations

Publisher Website

1 January 1991

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 79-80
https://doi.org/10.1109/vlsit.1991.705999

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Choice of power-supply voltage for half-micrometer and lower submicrometer CMOS devices
IEEE Transactions on Electron Devices, 1990