Alternative mechanism for substrate minority carrier injection in MOS devices operating in low level avalanche

Publisher Website
Google Scholar
Abstract
The mechanism proposed by Matsunaga et al. to explain the injection of minority carriers into the substrate of a saturated n-channel MOST cannot account for the size of the observed current. An alternative mechanism is suggested based on optical generation of minorities by radiation emitted by hot carriers in the drain depletion region. Evidence for this mechanism is presented.