Determination of the Optical Properties of Thin Films from Single-Angle Reflectance Measurements
- 1 July 1973
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 12 (7) , 1577-1580
- https://doi.org/10.1364/ao.12.001577
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Methods for Determining Film Thickness and Optical Constants of Films and SubstratesJournal of the Optical Society of America, 1971
- Anodic Oxide FilmsPublished by Elsevier ,1971
- Optical Properties of Anodic Oxide Films on Tantalum, Niobium, and Tantalum + Niobium Alloys, and the Optical Constants of TantalumJournal of the Electrochemical Society, 1961