Some aspects of damage models
- 1 August 1974
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 13 (4) , 253-257
- https://doi.org/10.1016/0026-2714(74)90103-6
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- A model for interaction of two renewal processes with threshold levelInformation and Control, 1974
- Shock Models and Wear ProcessesThe Annals of Probability, 1973
- A Method for Predicting System DowntimeIEEE Transactions on Reliability, 1968
- On a first passage problem in stochastic storage systems with total releaseJournal of Applied Probability, 1967
- The Status of Developments in the Theory of Stochastic Duels—IIOperations Research, 1967
- Reliability Analysis of a One-Unit SystemOperations Research, 1961
- On a Sojourn Time Problem in the Theory of Stochastic ProcessesTransactions of the American Mathematical Society, 1959