Digital signal processor control of scanned probe microscopes
- 1 July 1993
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (7) , 1874-1882
- https://doi.org/10.1063/1.1144462
Abstract
Digital signal processors have made it possible to control scanned probe microscopes using straightforward software emulations of analog circuits. Using a system consisting of a commercially available digital signal processor board interfaced to analog I/O, we have developed algorithms for self-optimizing feedback, raster generation (with hysteresis correction, sample tilt compensation, and scan rotation), lock-in detection, and automatic tip-sample approach. We also discuss an instruction parser that takes advantage of the digital architecture to allow automatic operation for extended periods.This publication has 16 references indexed in Scilit:
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