Accuracy in film-scanner intensity measurements

• 1 September 1970
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
• Vol. 26  (5) , 489-491
• https://doi.org/10.1107/s0567739470001286

Abstract

Keywords

• SYSTEMATIC ERRORS
• RANDOM ERRORS
• DIFFRACTION INTENSITIES
• INTENSITIES OBTAINED
• FILM SCANNER
• LOEBL MICRODENSITOMETER
• SAAB FILM
• SCANNER DATA