Computer software for specimen orientation adjustment using double‐tilt or rotation holders

1 December 1987

journal article
research article
Published by Wiley in Journal of Electron Microscopy Technique

Vol. 7 (4) , 263-268
https://doi.org/10.1002/jemt.1060070404

Abstract

Computer software for specimen orientation adjustment relative to the incident electron beam has been developed. The difficulties encountered when tilting severly strained, highly beam-sensitive, or small-grain-size specimens with known structures using either a double-tilt or a rotation holder in transmission electron miscroscopy (TEM) can be minimized. Combined with computer programs for obtaining the reduced bases from diffraction patterns, the software is also useful for unknown crystals. The algorithm is introduced and examples are given.

Keywords

This publication has 3 references indexed in Scilit:

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Acta Physica Sinica, 1980
Computer-aided indexing of transmission electron diffraction patterns
Metallography, 1977
Algorithm for determining the symmetry and stacking properties of the planes (hkl) in a Bravais lattice
Acta Crystallographica Section A, 1970