Bias-dependent annealing of radiation damage in neutron-irradiated silicon p+-n-n+ diodes
Open Access
- 1 December 1998
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 419 (1) , 132-136
- https://doi.org/10.1016/s0168-9002(98)81148-0
Abstract
No abstract availableKeywords
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