PRECIPITATION OF COPPER IN SILICON BICRYSTALS

1 January 1990

journal article
Published by EDP Sciences in Le Journal de Physique Colloques

Vol. 51 (C1) , C1-417
https://doi.org/10.1051/jphyscol:1990164

Abstract

Investigation of copper precipitates has been carried out in a Σ25 silicon bicrystal by transmission electron microscopy. Orientated precipitation occurs after high temperature annealing and fast cooling. Extra spots can be indexed using the lattice of η'-CuSi phase, lattice related to this of the β phase. Two orientation relationships are found

Keywords

COPPER IN SILICON BICRYSTALS
PRECIPITATION OF COPPER IN SILICON

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