Oxygen sticking coefficients on clean semiconductor surfaces
- 31 October 1965
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 3 (4) , 419-420
- https://doi.org/10.1016/0039-6028(65)90009-9
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Measurement of oxygen adsorption on silicon by ellipsometryJournal of Physics and Chemistry of Solids, 1965
- The oxidation of intermetallic compounds—IIIJournal of Physics and Chemistry of Solids, 1960