High-resolution transmission electron microscopy of cubic Si3N4
- 1 September 2000
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 88 (5) , 3070-3072
- https://doi.org/10.1063/1.1287765
Abstract
A cubic Si3N4 phase/nanostructure has been characterized by means of high-resolution analytical electron microscopy. The specimen prepared from β-Si3N4 powders at a high pressure and temperature by shock wave compression contained nanometer-sized Si3N4 crystallites. The results of nano-beam electron diffraction analysis and high-resolution lattice images as well as computer simulations revealed that the Si3N4 crystallites had a cubic symmetry with spinel structure. The electron energy loss spectrum suggested that the chemical compositions of these nanostructures were close to Si3N4.This publication has 5 references indexed in Scilit:
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