Multiple Reflection Effects in the Faraday Rotation in Thin-Film Semiconductors
- 1 April 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (5) , 1982-1988
- https://doi.org/10.1063/1.1708652
Abstract
The free‐carrier Faraday rotation has been measured at room temperature for an n‐type epitaxial PbS film at infrared wavelengths in the range 3–30 μ. The rotation as a function of wavelength shows oscillatory behavior due to multiple reflection effects. The oscillations are closely in step with those observed in the zero‐field transmittance of the sample. The effects are satisfactorily accounted for by exact calculations based on equations given by Donovan and Medcalf.This publication has 12 references indexed in Scilit:
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