Mass fraction profiling based on x-ray tomography and its application to characterizing porous silica boules
- 15 March 1987
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 26 (6) , 983-989
- https://doi.org/10.1364/ao.26.000983
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
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