Stress and strain in ferroelectrics
- 31 October 1998
- journal article
- Published by Elsevier in Current Opinion in Solid State and Materials Science
- Vol. 3 (5) , 486-489
- https://doi.org/10.1016/s1359-0286(98)80012-0
Abstract
No abstract availableKeywords
This publication has 37 references indexed in Scilit:
- Improvement of (Pb1−xLax)(ZryTi1−y)1−x/4O3 ferroelectric thin films by use of SrRuO3/Ru/Pt/Ti bottom electrodesApplied Physics Letters, 1998
- Cracking and Debonding in Integrated MicrostructuresMRS Proceedings, 1998
- Electrostriction: Nonlinear Electromechanical Coupling in Solid DielectricsThe Journal of Physical Chemistry B, 1997
- Intrinsic dead layer effect and the performance of ferroelectric thin film capacitorsJournal of Applied Physics, 1997
- The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor depositionJournal of Applied Physics, 1997
- Electrical Properties of All-Perovskite Oxide (SrRuO3/BaxSr1-xTiO3/SrRuO3) CapacitorsJapanese Journal of Applied Physics, 1997
- Ultrahigh strain and piezoelectric behavior in relaxor based ferroelectric single crystalsJournal of Applied Physics, 1997
- A finite element method for electrostrictive ceramic devicesInternational Journal of Solids and Structures, 1996
- Reliability of ceramic multilayer actuators: A nonlinear finite element simulationJournal of the Mechanics and Physics of Solids, 1996
- Fracture mechanics for the design of ceramic multilayer actuatorsJournal of the Mechanics and Physics of Solids, 1996