Monte Carlo calculations on the influence of attachment on the thermalization of secondary electrons in an electron-beam-sustained discharge

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Abstract
Monte Carlo calculations have been performed on the relaxation of initial secondary electrons in electron-beam-sustained discharges at low values of the reduced electric field strength, E/N. In pure nitrogen, thermalizing electrons contribute to a secondary maximum of the distribution function in the energy range between 3.5 and 8 eV where the cross section for inelastic collisions in nitrogen has a minimum. This maximum is not found if the secondary electrons are produced at low energies. Admixtures of attachers with an attachment cross section in this energy range cause significant attachment of the initial secondary electrons. The calculations also demonstrate that even in molecular buffer gases, the inelastic cross sections of the attacher admixture have to be considered to gain correct distribution functions and attachment rates.