Auger depth profiling and analysis of defects in tinplate surfaces
- 29 February 1980
- journal article
- Published by Elsevier in Materials Science and Engineering
- Vol. 42, 321-327
- https://doi.org/10.1016/0025-5416(80)90041-5
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- The depth resolution of sputter profilingApplied Physics A, 1979
- An Auger analysis of the SiO2-Si interfaceJournal of Applied Physics, 1976
- Phase separation in silicon oxides as seen by Auger electron spectroscopyApplied Physics Letters, 1975
- Auger parameter in electron spectroscopy for the identification of chemical speciesAnalytical Chemistry, 1975
- Modified Alloy Layers in TinplateTransactions of the IMF, 1969
- The Growth of FeSn[sub 2] Layers on Specifically Oriented Iron Single CrystalsJournal of the Electrochemical Society, 1966