Uniaxial anisotropy of organic thin films determined by ellipsometry
- 4 April 2008
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 205 (4) , 927-930
- https://doi.org/10.1002/pssa.200777765
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Optical properties of pentacene and perfluoropentacene thin filmsThe Journal of Chemical Physics, 2007
- On the optical anisotropy of conjugated polymer thin filmsPhysical Review B, 2005
- Recent Progress in Organic Electronics: Materials, Devices, and ProcessesChemistry of Materials, 2004
- Infrared ellipsometry characterization of conducting thin organic filmsThin Solid Films, 2004
- Infrared dielectric function and vibrational modes of pentacene thin filmsApplied Physics Letters, 2004
- Ellipsometric Determination of Anisotropic Optical Constants in Electroluminescent Conjugated PolymersAdvanced Materials, 2002
- Ellipsometric method for investigation of the optical anisotropy of thin films: theory and calculationsThin Solid Films, 1997
- Characterization of epitaxial semiconductor growth by reflectance anisotropy spectroscopy and ellipsometryProgress in Crystal Growth and Characterization of Materials, 1997
- Ellipsometry of anisotropic substrates: Re-examination of a special caseJournal of Applied Physics, 1994
- Optical properties of thin filmsThin Solid Films, 1982