Terahertz near-field microscopy based on a collection mode detector
- 27 November 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 77 (22) , 3496-3498
- https://doi.org/10.1063/1.1328772
Abstract
We report on the development of a collection mode near-field probe for the terahertz spectral range. The near-field detector is based on an aperture type probe with dimensions of 30×30 The collection mode technique provides higher sensitivity and higher resolution than the similar illumination mode approach. Spatial resolution better than 40 μm is demonstrated for a broad spectrum of 300–600 μm, which equals to λ/15 for the longest wavelength. The observed resolution is determined by the size of the probe aperture.
Keywords
This publication has 9 references indexed in Scilit:
- Near-field microscope probe for far infrared time domain measurementsApplied Physics Letters, 2000
- Recent advances in terahertz imagingApplied Physics B Laser and Optics, 1999
- THz near-field imagingOptics Communications, 1998
- Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengthsApplied Physics Letters, 1997
- Characterization of an optoelectronic terahertz beam systemIEEE Transactions on Microwave Theory and Techniques, 1990
- Near-zone fields behind circular apertures in thick, perfectly conducting screensJournal of Applied Physics, 1989
- Study of near-zone fields of a small apertureJournal of Applied Physics, 1986
- Near-field optical-scanning microscopyJournal of Applied Physics, 1986
- Theory of Diffraction by Small HolesPhysical Review B, 1944