Improved Uncertainty of Optical Frequency Domain Reflectometry Based Length Measurement by Linearizing the Frequency Chirping of a Laser Diode
- 1 July 2003
- journal article
- Published by Springer Nature in Optical Review
- Vol. 10 (4) , 182-184
- https://doi.org/10.1007/s10043-003-0182-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Multiplex imaging by a frequency-ramped laser-diode interferometerOptics Communications, 1998
- Experimental and theoretical investigations of coherent OFDR with semiconductor laser sourcesJournal of Lightwave Technology, 1994
- Coherent frequency-domain reflectometry for characterization of single-mode integrated-optical waveguidesJournal of Lightwave Technology, 1993
- High-resolution OFDR with incorporated fiber-optic frequency encoderIEEE Photonics Technology Letters, 1992
- Optical frequency domain reflectometry in single-mode fiberApplied Physics Letters, 1981