Electron spin resonance study on low-pressure-baked silicon surfaces

This publication has 28 references indexed in Scilit:

• Dangling bonds on silicon
  Physical Review B, 1978
• Electronic states at the silicon-silicon dioxide interface
  Progress in Surface Science, 1977
• Paramagnetic Defects in the Surface Region of Processed Silicon
  Published by American Chemical Society (ACS) ,1976
• Interface states on semiconductor/insulator surfaces
  C R C Critical Reviews in Solid State Sciences, 1976
• Low-Temperature EPR Measurements onin situVacuum-Cleaved Silicon
  Physical Review Letters, 1975
• New ESR Investigation of the Cleaved-Silicon Surface
  Physical Review Letters, 1975
• Investigation of passivation mechanism in silicon surfaces by electron spin resonance
  Surface Science, 1973
• Study of Silicon-Silicon Dioxide Structure by Electron Spin Resonance I
  Japanese Journal of Applied Physics, 1971
• Electron paramagnetic resonance investigation of the Si-SiO2 interface
  Surface Science, 1969
• Electron Paramagnetic Resonance from Clean Single-Crystal Cleavage Surfaces of Silicon
  Physical Review B, 1968