Voltage Breakdown of Ag Thin Film Deposited on Fractal Surface
- 1 January 1994
- journal article
- Published by IOP Publishing in Chinese Physics Letters
- Vol. 11 (1) , 43-45
- https://doi.org/10.1088/0256-307x/11/1/012
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Electrical breakdown measurements of semicontinuous metal filmsPhysical Review Letters, 1992
- ac conduction and 1/f noise in a Cr-film lattice-percolation systemPhysical Review B, 1992
- Fractals in nature: From characterization to simulationPublished by Springer Nature ,1988
- Statistical properties of low-connectivity bonds in percolation clustersJournal of Physics A: General Physics, 1986
- Critical currents of superconducting aluminium - germanium and lead - germanium thin film alloys near the metal - insulator transitionJournal de Physique Lettres, 1979
- Electrical and Structural Properties of Amorphous Metal—Metal-Oxide SystemsPhysical Review B, 1973