Routh-Hurwitz test under vanishing leading array elements
- 1 January 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Automatic Control
- Vol. 28 (1) , 104-106
- https://doi.org/10.1109/tac.1983.1103125
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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