Internal voltage in symmetric MIM junctions with even number of organic monolayers
- 1 April 1979
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 50 (4) , 2856-2858
- https://doi.org/10.1063/1.326200
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
- Experimental evidence for the temperature dependence of the barrier height in Al-Al2O3-metal tunneling junctionsPhysica Status Solidi (a), 1970
- Phonon Emission and Self-Energy Effects in Normal-Metal TunnelingPhysical Review B, 1969
- Metal-semiconductor surface barriersSolid-State Electronics, 1966
- Electron Transfer Processes through Tantalum—Tantalum-Oxide DiodesJournal of Applied Physics, 1966
- Photovoltage Measurements on an Al-Al2O3-Al Thin-Film SandwichJournal of Applied Physics, 1966
- Potential Barrier Parameters in Thin-Film Al–Al2O3-Metal DiodesJournal of Applied Physics, 1966
- Photocurrents Through Thin Films of Al2O3Journal of Applied Physics, 1965
- Photoemissive Determination of Barrier Shape in Tunnel JunctionsPhysical Review Letters, 1965
- Electron Tunneling Through Thin Aluminum Oxide FilmsPhysical Review B, 1964
- Intrinsic Fields in Thin Insulating Films between Dissimilar ElectrodesPhysical Review Letters, 1963