Convergent-beam electron diffraction study of transverse stacking faults and dislocations
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 17 (2) , 81-85
- https://doi.org/10.1016/0304-3991(85)90001-4
Abstract
No abstract availableKeywords
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