A Pulse Bias/RF Environment for Device Characterization

• 1 December 1993
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 57-60
• https://doi.org/10.1109/arftg.1993.327043

Abstract

Keywords

• TESTING
• SEMICONDUCTOR DEVICES
• THERMAL RESISTANCE
• RADIO FREQUENCY
• TEMPERATURE