Effect of Stress on the Hall Coefficient of Chromium Films

Abstract
Hall‐coefficient measurements have been made on vapor‐deposited chromium films in the temperature range from −195° to 150°C. The stress in the chromium films was estimated by the shift of Néel temperature and the differential thermal‐expansion coefficients between the substrate and the film. It was observed that compressive stress reduces the Hall coefficient of chromium and tensile stress increases it. A suggestion is made concerning the similarity between the effects of pressure and the effects of changing the number of 3d electrons in chromium.

This publication has 30 references indexed in Scilit: