Interaction of Ion Beams with Polymer Surfaces Leading to Etching and Sputtering Processes

Abstract
The investigation of etching and sputtering processes at polymer surfaces, especially PTFE, caused by 1–10 keV ions led to interesting results. At the target surface a characteristic "fibre-like" microstructure of quasicrystallites is developed, and the sputter yields of this selective surface etching are unusual high (≈102 CF2-groups per incident ion). Films deposited from these fragments with ion beam sputtering under high vacuum conditions are transparent, they possess a (100)-quasicrystalline orientation and a low friction coefficient.