Optical phase shift measurement of carrier decay-time on thin semiconductor samples with surface losses
- 1 October 1971
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 14 (10) , 1023-1033
- https://doi.org/10.1016/0038-1101(71)90171-7
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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