Switch-Level Techniques

• 1 January 1987
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
• Vol. 4  (4) , 15-16
• https://doi.org/10.1109/mdt.1987.295143

Abstract

Keywords

• SWITCHES
• CIRCUIT FAULTS
• CIRCUIT TESTING
• TEST PATTERN GENERATORS
• CIRCUIT SIMULATION
• DESIGN AUTOMATION
• AUTOMATIC TEST PATTERN GENERATION
• SWITCHING CIRCUITS
• VERY LARGE SCALE INTEGRATION
• ELECTRICAL FAULT DETECTION