Implementation of the transient response measurement of mixed-signal circuits

Publisher Website

31 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/etc.1993.246532

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Go/no-go testing of analogue macros
IEE Proceedings G Circuits, Devices and Systems, 1992