Use of high lateral resolution secondary-ion mass spectrometry to characterize self-assembled monolayers on microfabricated structures
- 1 August 1992
- journal article
- Published by American Chemical Society (ACS) in Journal of the American Chemical Society
- Vol. 114 (18) , 7142-7145
- https://doi.org/10.1021/ja00044a028
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: