Angle-resolved photoemission studies of the band structure of Tiand Ti
- 15 January 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 21 (2) , 615-624
- https://doi.org/10.1103/physrevb.21.615
Abstract
The electronic structure of high-quality Ti and Ti crystals has been investigated using angle-resolved photoemission with HeI, HeII, and NeI resonance radiation. Results compare well with recent self-consistent energy-band calculations although differences occur which may be due to the three- rather than two-dimensional nature of specific bands. Occupied states at the zone edge are observed in both materials. A small overlap with the valence band at is observed in the case of Ti in approximate agreement with other workers. Ti appears to be a defect semiconductor with a band gap of 0.3 ± 0.2 eV.
Keywords
This publication has 25 references indexed in Scilit:
- Modelling the contrasting semimetallic characters of TiS2 and TiSe2Physica Status Solidi (b), 1978
- Ti: Semiconductor, semimetal, or excitonic insulatorPhysical Review B, 1978
- Structural distortion in TiSe2and related materials-a possible Jahn-Teller effect?Journal of Physics C: Solid State Physics, 1977
- Concerning the semimetallic characters of TiS2 and TiSe2Solid State Communications, 1977
- Suppression of antiferroelectricity in TiSe2 by excess carriersIl Nuovo Cimento B (1971-1996), 1977
- Electronic properties and superlattice formation in the semimetalPhysical Review B, 1976
- Superlattice formation in titanium diselenidePhysical Review B, 1976
- Electron-Hole Scattering and the Electrical Resistivity of the SemimetalPhysical Review Letters, 1976
- Angle-Resolved Photoemission from TiUsing Synchrotron RadiationPhysical Review Letters, 1976
- Electron-Electron Scattering in TiPhysical Review Letters, 1975