Results of reliability tests on planar transistors

• 1 November 1968
• journal article
• Published by Elsevier in Microelectronics Reliability
• Vol. 7  (4) , 291-300
• https://doi.org/10.1016/0026-2714(68)90115-7

Abstract

Keywords

• PLANAR TRANSISTORS
• TESTS ON PLANAR
• RESULTS OF RELIABILITY TESTS